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Power MOSFET thermal instability operation characterization support

Main Author: Shue, John L.
Corporate Author: Langley Research Center.
Other Authors: Leidecker, Henning W.
Format: Government Document Online Book
Language:English
Published: Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2010]
Series:NASA technical memorandum ; 216684.
Subjects:
Online Access:ONLINE VERSION
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010 |a   
035 |a (OCoLC)679689185 
040 |a GPO  |c GPO  |d GPO  |d MvI 
049 |a WWW 
074 |a 0830-D (online) 
086 0 |a NAS 1.15:2010-216684 
100 1 |a Shue, John L. 
245 1 0 |a Power MOSFET thermal instability operation characterization support  |h [electronic resource] /  |c John L. Shue and Henning W. Leidecker. 
260 |a Hampton, Va. :  |b National Aeronautics and Space Administration, Langley Research Center,  |c [2010] 
300 |a 1 online resource (iv, 16 p.) :  |b ill. 
490 1 |a NASA/TM- ;  |v 2010-216684 
500 |a Title from title screen (viewed on Nov. 8, 2010). 
500 |a "April 2010." 
504 |a Includes bibliographical references (p. 16). 
536 |h 869021.03.07.01.19 
650 7 |a Metal oxide semiconductors.  |2 nasat 
650 7 |a Field effect transistors.  |2 nasat 
650 7 |a Thermal instability.  |2 nasat 
650 7 |a Charge carriers.  |2 nasat 
650 7 |a Ground support equipment.  |2 nasat 
700 1 |a Leidecker, Henning W. 
710 2 |a Langley Research Center. 
830 0 |a NASA technical memorandum ;  |v 216684. 
856 4 0 |u http://purl.fdlp.gov/GPO/gpo810  |z ONLINE VERSION 
852 |b WWW