Total ionizing dose test report for the SFT2222A NPN bipolar junction transistor /
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Total ionizing dose test report for the SFT2222A NPN bipolar junction transistor /

Bibliographic Details
Main Authors: Chen, Dakai, 1982- (Author), Forney, James (Author)
Format: Government Document Online Book
Language:English
Published: Greenbelt, Maryland : National Aeronautics and Space Administration, Goddard Space Flight Center, April 2021.
Series:NASA technical memorandum ; 20210010530.
Access:ONLINE VERSION
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