Cover Image
Saved in:

Applied logistic regression /

Bibliographic Details
Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley.
Format: Book
Language:English
Published: New York : Wiley, c1989.
Series:Wiley series in probability and mathematical statistics. Applied probability and statistics
Subjects:
Access:
Tags: Add Tag
No Tags, Be the first to tag this record!

Falvey Main - 4th Floor

Print materials are only available via contactless pickup while the library building is closed.

For more information, visit our contactless pickup page.

Holdings details from Falvey Main - 4th Floor
Call Number: QA278.2.H67 1989
Copy 1 On Shelf