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Applied logistic regression /

Bibliographic Details
Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley.
Format: Book
Published: New York : Wiley, c1989.
Series:Wiley series in probability and mathematical statistics. Applied probability and statistics
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Falvey Main - 4th Floor

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Holdings details from Falvey Main - 4th Floor
Call Number: QA278.2.H67 1989
Copy 1 On Shelf